Multi-scale three-dimensional characterization with dark-field X-ray microscopy
نویسندگان
چکیده
منابع مشابه
Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization
The authors inadvertently omitted Frederik Stöhr, who developed the silicon condenser lens used for the acquisition of data presented in this Article, from the author list. This has now been corrected in both the PDF and HTML versions of the Article.
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations and Advances
سال: 2017
ISSN: 2053-2733
DOI: 10.1107/s2053273317087228